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Layout dependent BTI and HCI degradation in nano CMOS technology: A new time-dependent LDE and impacts on circuit at end of life.
Pengpeng Ren
Runsheng Wang
Ru Huang
Published in:
ICICDT (2016)
Keyphrases
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cmos technology
low power
low voltage
human computer interaction
power dissipation
power consumption
spl times
parallel processing
high speed
low cost
image sensor
mixed signal
flip flops
neural network
pattern recognition
noisy images