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Soft Error Reliability Improvement of Digital Circuits by Exploiting a Fast Gate Sizing Scheme.

Mohsen RajiM. Amin SabetBehnam Ghavami
Published in: IEEE Access (2019)
Keyphrases
  • digital circuits
  • data flow
  • finite state machines
  • evolvable hardware
  • error rate
  • error accumulation
  • error bounds
  • model based diagnosis
  • circuit design
  • databases
  • cooperative
  • significant improvement