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Soft Error Reliability Improvement of Digital Circuits by Exploiting a Fast Gate Sizing Scheme.
Mohsen Raji
M. Amin Sabet
Behnam Ghavami
Published in:
IEEE Access (2019)
Keyphrases
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digital circuits
data flow
finite state machines
evolvable hardware
error rate
error accumulation
error bounds
model based diagnosis
circuit design
databases
cooperative
significant improvement