Impact of technology scaling on leakage power in nano-scale bulk CMOS digital standard cells.
Zia AbbasMauro OlivieriPublished in: Microelectron. J. (2014)
Keyphrases
- nano scale
- power consumption
- circuit design
- low cost
- digital media
- metal oxide semiconductor
- rapid development
- silicon on insulator
- case study
- cmos image sensor
- key technologies
- personal computer
- low power
- cost effective
- computer systems
- neural network
- digital technologies
- power management
- cmos technology
- chip design
- data processing
- information systems