Progress in Evaluation of Deep Artificial Defects from Sweep-Frequency Eddy-Current Testing Signals.
Milan SmetanaDaniela GombarskaZuzana PsenakovaPublished in: Sensors (2023)
Keyphrases
- eddy current
- signal processing
- evaluation methods
- short time fourier transform
- frequency modulation
- spectrum analysis
- evaluation criteria
- machine vision
- independent component analysis
- neural network
- evaluation model
- spectral analysis
- low signal to noise ratio
- frequency spectrum
- principal component analysis
- fundamental frequency
- information systems
- learning algorithm
- real world