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Exploiting Intracell Bit-Error Characteristics to Improve Min-Sum LDPC Decoding for MLC NAND Flash-Based Storage in Mobile Device.

Hongbin SunWenzhe ZhaoMinjie LvGuiqiang DongNanning ZhengTong Zhang
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2016)
Keyphrases
  • bit errors
  • error correction
  • flash memory
  • storage devices
  • computer vision
  • lower bound
  • decoding algorithm