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Addressing Parametric Impact of Systematic Pattern Variations in Digital IC Design.

Pei-Hua WangBrian LeeGus HanRichard RousePhilippe HuratNishath Verghese
Published in: CICC (2007)
Keyphrases
  • engineering design
  • pattern matching
  • circuit design
  • real world
  • artificial intelligence
  • user experience
  • conceptual framework
  • parametric models
  • integrated circuit
  • design tools
  • optimal design