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Performance of tri-gate AlGaN/GaN HEMTs.

Mohamed AlsharefRalf GranznerFrank SchwierzErdin TureRüdiger QuayOliver Ambacher
Published in: ESSDERC (2016)
Keyphrases
  • structuring elements
  • nano scale
  • cmos technology
  • multiple input
  • metadata
  • pattern recognition
  • high dimensional
  • dynamic programming
  • d objects
  • field effect transistors