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On the parametric failures of SRAM in a 3D-die stack considering tier-to-tier supply cross-talk.
Wen Yueh
Subho Chatterjee
Amit Ranjan Trivedi
Saibal Mukhopadhyay
Published in:
VTS (2012)
Keyphrases
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power consumption
real time
information systems
data structure
learning environment
multiresolution
probabilistic model
low power