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Modeling RF-Induced Power Deposition and Temperature Rise of Coaxial Leads with Helical Wires.

Mikhail KozlovMarc HornerWolfgang Kainz
Published in: EMBC (2019)
Keyphrases
  • rf sputtering
  • artificial intelligence
  • power consumption
  • power management
  • genetic algorithm
  • information systems
  • ct scans
  • modeling framework