MPI-Based System 2 for Determining LPBF Process Control Thresholds and Parameters.
Muhammad AdnanHaw Ching YangTsung-Han KuoFan-Tien ChengHong-Chuong TranPublished in: IEEE Robotics Autom. Lett. (2021)
Keyphrases
- process control
- control system
- manufacturing process
- intelligent control
- semiconductor manufacturing
- general purpose
- parameter space
- parameter estimation
- sensitivity analysis
- parameter settings
- graduate education
- genetic algorithm
- threshold values
- parallel computing
- shared memory
- expectation maximization
- maximum likelihood
- hidden markov models
- image sequences