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Self-Heating characterization and modeling of 5nm technology node FinFETs.

Shivendra S. PariharJun Z. HuangWeike WangKimihiko ImuraYogesh Singh Chauhan
Published in: DRC (2022)
Keyphrases
  • modeling method
  • case study
  • image segmentation
  • data structure
  • pattern recognition
  • image analysis
  • wireless sensor networks
  • power consumption
  • directed graph
  • nm technology