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Basic metrology for 2020.

Richard DavisStephan Schlamminger
Published in: IEEE Instrum. Meas. Mag. (2020)
Keyphrases
  • camera calibration
  • single view
  • process control
  • multi view
  • multiple views
  • computer vision
  • real time
  • object recognition
  • learning process
  • missing data
  • production system
  • shape from shading