Improving the Security of Split Manufacturing Using a Novel BEOL Signal Selection Method.
Suyuan ChenRanga VemuriPublished in: ACM Great Lakes Symposium on VLSI (2018)
Keyphrases
- preprocessing
- significant improvement
- high accuracy
- cost function
- wavelet analysis
- computational cost
- support vector machine svm
- similarity measure
- synthetic data
- clustering method
- selection scheme
- fine tuning
- selection algorithm
- high precision
- classification method
- detection method
- experimental evaluation
- multiscale