Combining the histogram method and the ultrafast segmented model identification of linearity errors algorithm for ADC linearity testing.
Weida ChenYongxin ZhuXinyi LiuXinyang LiDongyu OuPublished in: ETS (2016)
Keyphrases
- mathematical model
- cost function
- theoretical analysis
- objective function
- probabilistic model
- recognition algorithm
- high accuracy
- algorithm employs
- estimation algorithm
- input data
- classification algorithm
- dynamic programming
- em algorithm
- hyper graph
- optimization method
- classification method
- detection algorithm
- final result
- identification rate
- parameter estimation
- optimization algorithm
- clustering method
- selection algorithm
- computational cost
- prior information
- preprocessing
- optimization model
- energy function
- reconstruction method
- detection method
- improved algorithm
- linear model
- similarity measure
- tree structure
- verification method
- residual error
- test data
- significant improvement
- segmentation method
- computational complexity
- model free
- support vector machine svm
- segmentation algorithm
- bayesian framework
- matching algorithm
- closed form
- k means
- transfer function
- multiple models
- prediction error
- background model
- geometric constraints
- kalman filter
- learning algorithm
- convergence rate
- simulated annealing
- particle filter
- optimal solution
- mean shift