Login / Signup

Automated parameter extraction and modeling of the MOSFET below threshold.

Allan SilburtA. R. BoothroydM. Digiovanni
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1988)
Keyphrases
  • fully automated
  • parameter values
  • modeling method
  • database
  • data driven
  • computer aided
  • window size
  • modeling framework
  • databases
  • artificial intelligence
  • information systems
  • parameter tuning