Semi-automatic wafer map pattern classification with convolutional neural networks.
Suhee YoonSeokho KangPublished in: Comput. Ind. Eng. (2022)
Keyphrases
- semi automatic
- pattern classification
- convolutional neural networks
- fully automatic
- nearest neighbor rule
- convolutional network
- pattern recognition
- fuzzy classifier
- semi automatically
- feature extraction
- gold standard
- maximum a posteriori
- domain ontology
- semantic annotation
- radial basis function neural network
- wrapper generation
- ontology mapping
- ontology engineering
- parzen window
- pattern classification problems
- landmark extraction
- machine learning