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Provably Fast and Near-Optimum Gate Sizing.

Siad DaboulNicolai HähnleStephan HeldUlrike Schorr
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2018)
Keyphrases
  • worst case
  • global optimum
  • knowledge base
  • real time
  • multiple input
  • power losses
  • database
  • neural network
  • computer vision
  • decision trees
  • case study
  • multiscale
  • theoretical guarantees
  • nano scale