Application of an Ordinal Optimization Algorithm to the Wafer Testing Process.

S.-Y. Lin S.-C. Horng

Published in: IEEE Trans. Syst. Man Cybern. Part A (2006)

Keyphrases

optimization algorithm
multi objective
differential evolution
optimization method
particle swarm optimization pso
optimization strategy
testing process
neural network
evolutionary multi objective
data sets
decision trees
life cycle
control parameters
global optima