Modelling of the threshold voltage distributions of sub-20nm NAND flash memory.
Thomas P. ParnellNikolaos PapandreouThomas MittelholzerHaralampos PozidisPublished in: GLOBECOM (2014)
Keyphrases
- flash memory
- solid state
- metal oxide
- garbage collection
- file system
- buffer management
- random access
- disk drives
- main memory
- embedded systems
- b tree
- database systems
- data storage
- small size
- storage devices
- power system
- hand held devices
- storage systems
- memory management
- neural network
- general purpose
- data analysis
- feature selection
- data mining