Design of high-reliability LDO with current limiting characteristics with built-in new high tolerance ESD protection circuit.
Jin-Woo JungYong-Seo KooKwang-Yeob LeePublished in: IEICE Electron. Express (2013)
Keyphrases
- high reliability
- high precision
- circuit design
- low cost
- real time
- current status
- low overhead
- user interface
- building blocks
- analog circuits
- design requirements
- computer aided
- design principles
- design decisions
- information systems
- cmos technology
- chip design
- design space
- privacy preserving
- software development
- high speed
- multi agent systems
- wide range
- data mining