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An In-Depth and Black-Box Characterization of the Effects of Laser Pulses on ATmega328P.

Dilip S. V. KumarArthur BeckersJosep BalaschBenedikt GierlichsIngrid Verbauwhede
Published in: CARDIS (2018)
Keyphrases
  • black box
  • black boxes
  • white box
  • test cases
  • depth map
  • state transition
  • rule extraction
  • database systems
  • depth information
  • hybrid systems
  • high level
  • integration testing
  • white box testing