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ECC-Less Multi-Level SRAM Physically Unclonable Function and 127% PUF-to-Memory Capacity Ratio with No Bitcell Modification in 28nm.

Joydeep BasuSachin TanejaViveka Konandur RajannaTianqi WangMassimo Alioto
Published in: VLSI Technology and Circuits (2023)
Keyphrases
  • memory capacity
  • storage capacity
  • main memory databases
  • power consumption
  • low power
  • data transmission
  • electronic devices
  • neural network
  • data structure