Too Trivial To Test? An Inverse View on Defect Prediction to Identify Methods with Low Fault Risk.

Rainer Niedermayr Tobias Röhm Stefan Wagner

Published in: CoRR (2018)

Keyphrases

preprocessing
computational cost
statistical tests
decision making
significant improvement
qualitative and quantitative
learning algorithm
knowledge discovery
object oriented
data management
benchmark datasets
machine learning methods
risk assessment
statistical significance