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Reliability modeling and analysis of SiC MOSFET power modules.

Zhijie QiuJin ZhangPuqi NingXuhui Wen
Published in: IECON (2017)
Keyphrases
  • image analysis
  • knowledge base
  • reliability analysis
  • natural language
  • data analysis
  • genetic algorithm
  • metadata
  • image segmentation
  • building blocks
  • structural analysis