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A method to assess the robustness of cryptographic circuits at the design stage.
M. Arévalo-Garbayo
Marta Portela-García
Mario García-Valderas
Celia López-Ongil
Luis Entrena
Published in:
Microelectron. J. (2014)
Keyphrases
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computational cost
synthetic data
neural network
pairwise
segmentation method
learning algorithm
theoretical analysis
optimization algorithm
classification method
fully automatic
optimization method
data sets
preprocessing
dynamic programming
experimental evaluation
feature set