Login / Signup
Half-Select Free and Bit-Line Sharing 9T SRAM for Reliable Supply Voltage Scaling.
Kyungho Shin
Woong Choi
Jongsun Park
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2017)
Keyphrases
</>
random access memory
power consumption
cost effective
information sharing
selection algorithm
design considerations
data transmission
share information
database
learning algorithm
line segments
knowledge sharing
line drawings
low power
highly accurate