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Automatic BRAM Testing for Robust Dynamic Voltage Scaling for FPGAs.

Ibrahim AhmedShuze ZhaoJames MeijersOlivier TrescasesVaughn Betz
Published in: FPL (2018)
Keyphrases
  • dynamic environments
  • partial occlusion
  • genetic algorithm
  • image processing
  • artificial neural networks
  • computationally efficient
  • test cases
  • robust estimation
  • high voltage