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Figure-of-merit optimization of a low noise amplifier in 180 nm CMOS.

Hans Herman HansenTrond Ytterdal
Published in: ECCTD (2011)
Keyphrases
  • figure of merit
  • edge detector
  • cmos technology
  • high speed
  • power consumption
  • optimization problems
  • signal to noise ratio
  • noise level
  • global optimization
  • sar images
  • nm technology