Efficiently Testable Circuits.

Mirza Ahad Baig Suvradip Chakraborty Stefan Dziembowski Malgorzata Galazka Tomasz Lizurej Krzysztof Pietrzak

Published in: ITCS (2023)

Keyphrases

multiscale
high speed
databases
data mining
computer vision
knowledge base
decision trees
preprocessing
wireless sensor networks
fault diagnosis
delay insensitive