Langevin Forces and Generalized Transfer Fields for Noise Modelling in Deep Submicron Devices.
Pavel ShiktorovEvjeni StarikovViktor GruzinskisTomás GonzálezJavier MateosDaniel PardoLuca ReggianiLuca VaraniJean Claude VaissièrePublished in: VLSI Design (2001)
Keyphrases
- mobile devices
- random noise
- vlsi circuits
- computer vision
- noise level
- noise reduction
- mobile applications
- low signal to noise ratio
- gaussian noise
- additive noise
- deep learning
- electron beam
- machine learning
- semi supervised
- input data
- missing data
- signal to noise ratio
- multiscale
- median filter
- image processing
- embedded devices