A Fault Modeling Technique to Test Memory BIST Algorithms.

Raja Venkatesh Sailesh Kumar Joji Philip Sunil Shukla

Published in: MTDT (2002)

Keyphrases

learning algorithm
recently developed
post hoc
memory usage
times faster
data structure
memory requirements
worst case
neural network
theoretical analysis
limited memory
fault diagnosis
benchmark datasets
data mining techniques
search algorithm
bayesian networks
case study
machine learning