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Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits.

Guoyan ZhangRonan Farrell
Published in: DDECS (2006)
Keyphrases
  • radio frequency
  • digital circuits
  • electronic circuits
  • high speed
  • analog circuits
  • information retrieval
  • artificial intelligence
  • circuit design
  • delay insensitive
  • image processing