A new model-based approach for industrial visual inspection.
Yung-Nien SunChing-Tsorng TsaiPublished in: Pattern Recognit. (1992)
Keyphrases
- visual inspection
- statistical model
- probability distribution
- mathematical model
- high level
- probabilistic model
- genetic algorithm
- theoretical analysis
- theoretical framework
- mutual information
- automated analysis
- industrial applications
- formal model
- computational model
- management system
- expert systems
- objective function
- case study
- learning algorithm