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Reliability analysis of temperature step-stress tests on III-V high concentrator solar cells.

José Ramón GonzálezManuel VázquezNeftalí NúñezCarlos AlgoraIgnacio Rey-StolleBeatriz Galiana
Published in: Microelectron. Reliab. (2009)
Keyphrases
  • reliability analysis
  • machine learning
  • artificial intelligence
  • data mining
  • knowledge base
  • rough sets
  • linear programming