Simultaneous measurements of metal thickness and defect depth using low frequency sweeping eddy current testing.
Saibo SheZihan XiaXinnan ZhengWuliang YinPublished in: I2MTC (2024)
Keyphrases
- low frequency
- eddy current
- electromagnetic fields
- magnetic field
- high frequency
- frequency domain
- wavelet transform
- grain size
- wavelet analysis
- frequency band
- subband
- electromagnetic field
- discrete wavelet transform
- low pass
- high resolution
- time of flight
- original images
- wavelet coefficients
- high frequency components
- image analysis
- multiscale
- wavelet domain
- depth map