Pseudo-labeling and clustering-based active learning for imbalanced classification of wafer bin map defects.
Siyamalan ManivannanPublished in: Signal Image Video Process. (2024)
Keyphrases
- active learning
- class imbalance
- batch mode active learning
- machine learning
- selective sampling
- supervised learning
- active learning framework
- rare class
- cost sensitive
- labeling effort
- machine learning methods
- image classification
- classification accuracy
- imbalanced class distribution
- training set
- pattern recognition
- support vector
- sample selection
- imbalanced data classification
- imbalanced datasets
- random selection
- support vector machine svm
- labeled instances
- model selection
- feature vectors
- annotation effort
- feature extraction
- decision trees
- batch mode
- classification method
- imbalanced data
- binary classification problems
- classification models
- class labels
- unsupervised learning
- text classification
- feature space
- image segmentation
- learning algorithm
- binary classification
- random sampling
- maximum a posteriori
- single class
- semi supervised learning
- semi supervised
- multi class
- pairwise