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Statistical Observations of Three Co-Existing NBTI Behaviors in 28 nm HKMG by On-Chip Monitor With Less Recovery Impact.

Yarong FuWang WangXin ZhongManni LiZixu LiQing DongYu JiangYinyin Lin
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2022)
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