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Mapping Reliability Predictors of Low-Voltage Metal Oxide Surge Arresters Using Contour Plots.
Pitshou Bokoro
Wesley Doorsamy
Published in:
IEEE Access (2020)
Keyphrases
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low voltage
metal oxide
x ray
power line
design considerations
solid state
high speed
cmos technology
real time
power consumption
video sequences
low cost
power management