Login / Signup
Large-Scale SRAM Variability Characterization in 45 nm CMOS.
Zheng Guo
Andrew Carlson
Liang-Teck Pang
Kenneth Duong
Tsu-Jae King Liu
Borivoje Nikolic
Published in:
IEEE J. Solid State Circuits (2009)
Keyphrases
</>
power consumption
cmos technology
low power
random access memory
nm technology
low voltage
leakage current
real life
small scale
data sets
low cost
parallel processing
data transmission
power supply
power management
web scale
power reduction
design considerations
real world
single chip
high speed
neural network