Wafer Quality Inspection using Memristive LSTM, ANN, DNN and HTM.

Kazybek Adam Kamilya Smagulova Olga Krestinskaya Alex Pappachen James

Published in: CoRR (2018)

Keyphrases

artificial neural networks
recurrent neural networks
quality control
high quality
low quality
using artificial neural networks
higher quality
service quality
considerable increase
genetic algorithm
computer vision
database systems
search algorithm
expert systems
fuzzy logic
genetic algorithm ga