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Intensity Correction and Standardization for Electron Microscopy Data.
Oleh Dzyubachyk
Roman I Koning
Aat A. Mulder
M. Christina Avramut
Frank G. A. Faas
Abraham J. Koster
Published in:
MIDL (2021)
Keyphrases
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data sets
database
data collection
data analysis
image stacks
electron microscopy
data processing
image data
training data
data points
knowledge discovery
data sources
high quality
raw data
data management
high dimensional
synthetic data
data quality
neural network