Product Defect Detection Based on Multi-Class Classification.

Takumi Meguro Shota Nakada Qiangfu Zhao

Published in: IIAI-AAI (2022)

Keyphrases

multi class classification
defect detection
multi class
binary classification
multi class boosting
multi class svm
feature extraction
multi class support vector machines
support vector
multi task learning
binary classifiers
ordinal classification
data mining