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Complementary FET (CFET) Standard Cell Design for Low Parasitics and Its Impact on VLSI Prediction at 3-nm Process.
Eun-Bin Park
Taigon Song
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2023)
Keyphrases
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infrared
design process
chip design
signal processing
prediction accuracy
user interface
metamodel
building blocks
case study
knowledge based systems
design principles
high speed
engineering design
design methodology
manufacturing process
single chip
physical design
vlsi design
manufacturing cell