Efficient and Accurate Statistical Analog Yield Optimization and Variation-Aware Circuit Sizing Based on Computational Intelligence Techniques.
Bo LiuFrancisco V. FernándezGeorges G. E. GielenPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2011)
Keyphrases
- machine learning
- computational intelligence
- circuit design
- computationally efficient
- analog vlsi
- data mining
- analog circuits
- cost effective
- digital circuits
- optimization problems
- statistical analysis
- neural network
- optimization model
- information retrieval
- high accuracy
- genetic algorithm
- lightweight
- high precision
- power consumption
- optimization process