Signature Testing and Diagnosis of High Precision S? ADC Dynamic Specifications Using Model Parameter Estimation.
Sehun KookAritra BanerjeeAbhijit ChatterjeePublished in: ETS (2011)
Keyphrases
- parameter estimation
- high precision
- maximum likelihood
- em algorithm
- probabilistic model
- least squares
- parameter values
- random fields
- gibbs sampling
- maximum likelihood estimation
- statistical models
- parameters estimation
- machine learning
- model fitting
- statistical model
- parameter estimation algorithm
- achieve high precision
- high reliability
- closed form
- experimental data
- prior knowledge