Discriminative metric design for pattern recognition.
Hideyuki WatanabeTsuyoshi YamaguchiShigeru KatagiriPublished in: ICASSP (1995)
Keyphrases
- pattern recognition
- machine learning
- feature extraction
- information retrieval
- neural network
- real time
- case study
- database systems
- dimensionality reduction
- design process
- building blocks
- optimal design
- metric learning
- metric space
- pattern classification
- user experience
- unsupervised learning
- image analysis
- user interface
- image processing
- computer vision
- artificial intelligence