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Multi-illumination Imaging System with CNN Machine Learning Applied to Optical Inspection of Highly Complex Specimen.
Cheng-Ru Li
Ching-Ching Yang
Yin-Ting Su
Hsin-Yi Tsai
Kuo-Cheng Huang
Yu-Hsuan Lin
Published in:
I2MTC (2023)
Keyphrases
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highly complex
machine learning
artificial intelligence
pattern recognition
support vector machine
natural language processing
computer vision
data analysis
active learning
knowledge acquisition
learning algorithm
decision trees
computer science
explanation based learning
defect detection