Login / Signup
Using Bayesian Networks to Accurately Calculate the Reliability of Complementary Metal Oxide Semiconductor Gates.
Walid Ibrahim
Valeriu Beiu
Published in:
IEEE Trans. Reliab. (2011)
Keyphrases
</>
metal oxide semiconductor
bayesian networks
low cost
integrated circuit
image sensor
probability distribution
probabilistic model
conditional probabilities
real time
information systems
image processing
multiscale
digital images
high speed
machine vision