A 2-D analytical threshold-voltage model for GeOI/GeON MOSFET with high-k gate dielectric.

Feng Ji J. P. Xu L. Liu W. M. Tang P. T. Lai

Published in: Microelectron. Reliab. (2016)

Keyphrases

computational model
conceptual model
data sets
formal model
mathematical model
statistical model
real time
neural network
wide range
prior knowledge
probabilistic model
input data
experimental data