Impact of gate-leakage currents on CMOS circuit performance.
Alessandro MarrasIlaria De MunariDavide VescoviPaolo CiampoliniPublished in: Microelectron. Reliab. (2005)
Keyphrases
- cmos technology
- low voltage
- low power
- leakage current
- high speed
- circuit design
- analog vlsi
- nm technology
- power consumption
- delay insensitive
- metal oxide semiconductor
- power dissipation
- vlsi circuits
- parallel processing
- low cost
- mixed signal
- multiple input
- real time
- image sensor
- power supply
- focal plane
- logic circuits
- field effect transistors
- image processing